Improved Linear-Light-Source Material Reflectance Scanning (bibtex)

by Meseth, Jan, Hempel, Shawn, Weidlich, Andrea, Fyffe, Graham, Miller, Craig, Carroll, Paul, Debevec, Paul and Fyffe, Lynn

Abstract:

We improve the resolution, accuracy, and efﬁciency of Linear Light Source (LLS) Reﬂectometry with several acquisition setup and data processing improvements, allowing spatiallyvarying reﬂectance parameters of complex materials to be recorded with unprecedented accuracy and efﬁciency.

View PDF

Reference:

Improved Linear-Light-Source Material Reflectance Scanning (Meseth, Jan, Hempel, Shawn, Weidlich, Andrea, Fyffe, Graham, Miller, Craig, Carroll, Paul, Debevec, Paul and Fyffe, Lynn), In ACM SIGGRAPH 2012 Talks, 2012.

Bibtex Entry:

@inproceedings{meseth_improved_2012,
	title = {Improved {Linear}-{Light}-{Source} {Material} {Reflectance} {Scanning}},
	url = {http://ict.usc.edu/pubs/Improved%20Linear-Light-Source%20Material%20Reflectance%20Scanning.pdf},
	abstract = {We improve the resolution, accuracy, and efﬁciency of Linear Light Source (LLS) Reﬂectometry with several acquisition setup and data processing improvements, allowing spatiallyvarying reﬂectance parameters of complex materials to be recorded with unprecedented accuracy and efﬁciency.},
	booktitle = {{ACM} {SIGGRAPH} 2012 {Talks}},
	author = {Meseth, Jan and Hempel, Shawn and Weidlich, Andrea and Fyffe, Graham and Miller, Craig and Carroll, Paul and Debevec, Paul and Fyffe, Lynn},
	month = aug,
	year = {2012},
	keywords = {Graphics}
}