Improved Linear-Light-Source Material Reflectance Scanning (bibtex)
by Meseth, Jan, Hempel, Shawn, Weidlich, Andrea, Fyffe, Graham, Miller, Craig, Carroll, Paul, Debevec, Paul and Fyffe, Lynn
Abstract:
We improve the resolution, accuracy, and efficiency of Linear Light Source (LLS) Reflectometry with several acquisition setup and data processing improvements, allowing spatiallyvarying reflectance parameters of complex materials to be recorded with unprecedented accuracy and efficiency.
Reference:
Improved Linear-Light-Source Material Reflectance Scanning (Meseth, Jan, Hempel, Shawn, Weidlich, Andrea, Fyffe, Graham, Miller, Craig, Carroll, Paul, Debevec, Paul and Fyffe, Lynn), In ACM SIGGRAPH 2012 Talks, 2012.
Bibtex Entry:
@inproceedings{meseth_improved_2012,
	title = {Improved {Linear}-{Light}-{Source} {Material} {Reflectance} {Scanning}},
	url = {http://ict.usc.edu/pubs/Improved%20Linear-Light-Source%20Material%20Reflectance%20Scanning.pdf},
	abstract = {We improve the resolution, accuracy, and efficiency of Linear Light Source (LLS) Reflectometry with several acquisition setup and data processing improvements, allowing spatiallyvarying reflectance parameters of complex materials to be recorded with unprecedented accuracy and efficiency.},
	booktitle = {{ACM} {SIGGRAPH} 2012 {Talks}},
	author = {Meseth, Jan and Hempel, Shawn and Weidlich, Andrea and Fyffe, Graham and Miller, Craig and Carroll, Paul and Debevec, Paul and Fyffe, Lynn},
	month = aug,
	year = {2012},
	keywords = {Graphics}
}
Powered by bibtexbrowser